Title : Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET


Authors : Nabil Shovon Ashraf


Publication Year : 2018
Pages : 1-89 Location : California, USA Edition : Vol. 4, No. 1 Editors : Kris Iniewski
ISBN : 9781681733852, 9781681733876
Other Information:
Keywords: threshold voltage, substrate temperature, on-state drain current, subthreshold leakage current, bulk mobility, channel mobility